A Combined Waste Gas-Particle Removal System for Semiconductor Industry

碩士 === 國立交通大學 === 環境工程所 === 91 === The packed tower inside a thermal-type local scrubber can''t remove particles generated in the reaction chamber with high efficiency. It will cause the emission of fine particles. The study combines a local scrubber and a high efficiency venturi scrubber...

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Bibliographic Details
Main Authors: Chia-Hung, Lin, 林家弘
Other Authors: 蔡春進
Format: Others
Language:zh-TW
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/80310977290522547941