Effects of Forming Gas Annealing on the Recovery of Radiation Damaged Power MOSFETs
碩士 === 國立交通大學 === 電子工程系 === 91 === This thesis study investigates the radiation effect of power MOSFETs as well as the forming gas annealing effect on the recovery of the radiation damaged devices. It is found that Co-60 irradiation resulted in threshold voltage (Vth) shift toward the neg...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/95883309951536144600 |