Reliability Study of Dynamic Thrshold Voltage SOI P-MOSFETs with Various Structures at Different Temperatures
碩士 === 國立交通大學 === 電子工程系 === 91 === In this study, the reliability of p-channel dynamic threshold voltage MOSFETs (DTMOS) is characterized. With increasing demands in high-speed and low-power digital electronics in recent years, DTMOS with its lower threshold voltage, higher transconductan...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/01910434163399624163 |