Manufacturing Defect Detection using Data Mining Approach

碩士 === 國立交通大學 === 資訊科學系 === 91 === In recent years, the procedure of manufacturing has become more and more complex. In order to meet high expectation on quality target, quick identification of root cause that makes defects is an essential issue. Traditional statistic-based methods are st...

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Bibliographic Details
Main Authors: Yu-Lin Kuo, 郭毓麟
Other Authors: Shian-Shyong Tseng
Format: Others
Language:en_US
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/39119209999990598665