A Hybrid Method on Functional Testing for Embedded Processor Cores
碩士 === 國立成功大學 === 電機工程學系碩博士班 === 91 === With rapidly advanced VLSI manufacturing technology, it is possible to have an enormous number of transistors on a single die. These technology advances make system-on-chip (SOC) with shorter time-to-market, higher performance and lower manufacturing cost beco...
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| Format: | Others |
| Language: | en_US |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/81372199346131258023 |