The effect of finger gate structure on the RF Characteristics of deep-submicron MOS transistor

碩士 === 國立成功大學 === 微電子工程研究所碩博士班 === 91 === In the thesis, the effects of external parasitic elements on the radio frequency (RF) characteristics of CMOSFET, such as cut-off frequency (fT) and maximum oscillation frequency (f max) were studied in detail. As the device size is scaling down continuously...

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Bibliographic Details
Main Authors: Chao-Ching Ku, 古朝璟
Other Authors: Wen-Kuan Yeh
Format: Others
Language:en_US
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/87769046396401229703