BIST and DFT Techniques for Delay Faults Testing of Iterative Logic Arrays
碩士 === 輔仁大學 === 電子工程學系 === 91 === Iterative Logic Arrays (ILAs) are widely used in many applications, e.g., general-purpose processors, digital signal processors, and embedded processors. The rapid growth in VLSI technology is increasing the degree of circuit integration. So more and more...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/68294205604193052076 |