A TLS-Based Output Response Analyzer for BIST
碩士 === 淡江大學 === 電機工程學系 === 90 === For the increasing gate counts of circuits, testing becomes more and more difficult. The most important objective to choose a useful testing strategy are that : Small area overhead and high efficiency, with lower test application time, to reduce the cost...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/87232471715617582819 |