The design and realization of the timing generator with cyclic delay line in automatic test equipment
碩士 === 國立臺灣大學 === 電機工程學研究所 === 90 === Timing generator (TG) is the heart of Automatic Test Equipment（ATE）. The timing generators are used to generate the stimulus for the Device Under Test（DUT）and determine when to compare the device outputs against expect data. A CMOS implementation is p...
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| Format: | Others |
| Language: | en_US |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/80389170993892720835 |