Interfacial Reactions of Ytterbium Metal Thin Films on Silicon
博士 === 國立清華大學 === 材料科學工程學系 === 90 === Abstract Interfacial reactions of Yb thin films on silicon have been studied by Auger electron spectroscopy (AES), glancing incidence X-ray diffractometry (GIXRD), scanning electron microscopy (SEM), transmission electron microscopy (T...
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| Format: | Others |
| Language: | en_US |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/28729379305344607291 |