A Dynamic Dispatching Approach for Semiconductor Wafer Test
碩士 === 國立清華大學 === 工業工程與工程管理學系 === 90 === With the development of semiconductor advanced technologies (0.15um à 0.13um à 90nm) is rising and competing drastically, the wafer test plays a more significantly important role in providing the promptest yield feedback for quick process improvement. Nevert...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/93703213696360343540 |