Auto-Detection Systems of Semiconductor Testing

碩士 === 國立交通大學 === 電資學院學程碩士班 === 90 === It is known that testing plays a very important role in the IC manufacturing process due to the requirements of high quality and low cost for IC product. How to provide an efficient way for IC testing becomes one of most...

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Bibliographic Details
Main Authors: Yung-Chen Lin, 林泳辰
Other Authors: Der-Cherng Liaw
Format: Others
Language:zh-TW
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/58464642971324992229