LCD source driver IC testing:fault coverage improvement and early failure rate reduction

碩士 === 國立交通大學 === 電資學院學程碩士班 === 90 ===

Bibliographic Details
Main Author: 楊振瀛
Other Authors: 李崇仁
Format: Others
Language:zh-TW
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/31327419960775416952