Applying Computer Vision And Neural Network for BGA Inspection System
碩士 === 國立交通大學 === 電機與控制工程系 === 90 === This paper applies computer vision and the improved Self-Organizing Map (SOM) network techniques to perform BGA measurement and defect inspection. The basic structure of the investigated system is, mainly, to automatically measure or inspect, one by o...
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2002
|
Online Access: | http://ndltd.ncl.edu.tw/handle/66380653535117139624 |