Applying Computer Vision And Neural Network for BGA Inspection System

碩士 === 國立交通大學 === 電機與控制工程系 === 90 === This paper applies computer vision and the improved Self-Organizing Map (SOM) network techniques to perform BGA measurement and defect inspection. The basic structure of the investigated system is, mainly, to automatically measure or inspect, one by o...

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Bibliographic Details
Main Authors: SHANG-YUAN CHANG, 張上淵
Other Authors: Shir-Kuan Lin
Format: Others
Language:zh-TW
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/66380653535117139624