Study of Nanoscale Surface Optical and Electrical Properties by Scanning Probe Microscopy
博士 === 國立交通大學 === 電子物理系 === 90 === As technology advances, producing lighter, thinner and smaller electro-optics components have becomes a vital requirement in manufacturing process. Similarly, the techniques of analyzing and testing of components must be upgraded to meet these changes....
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/54450992074420462887 |