A Numerical Investigation of Scale Effects for 3D CSP

碩士 === 國立成功大學 === 工程科學系碩博士班 === 90 === A numerical investigation of the scale effects for 3D CSP, including single CSP, stacked CSP and triple-chip stacked CSP, subjected to thermal cyclic loading is presented. The emphasis is on the effects of die attach thickness, substrate thickness, substrate ma...

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Bibliographic Details
Main Authors: Yu-Ju Chen, 陳育儒
Other Authors: Jung-Hua Chou
Format: Others
Language:zh-TW
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/rrkke9