The Development of Auto-Test System and Computer Aided Test Using NI PXI and LabWindows/CVI
碩士 === 中原大學 === 電機工程研究所 === 90 === ABSTRACT Due to the complexity of the industrial products and its massive production lines in current days, the traditional labor intensive testing mechanism can no longer meet the demands of mass production and timing. Thus, the rapid growth of methodologies...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/82870687093352331914 |