The Improvement of Hot Carrier Reliability Issues on Embeddable Low Power DINOR Flash Cell With STI Structure

碩士 === 國立臺北科技大學 === 機電整合研究所 === 89 === Recently, due to the semiconductor element fabrication technology has developed very rapid in flash memory technology. It has been widely employed in non-volatile semiconductor memories such as: IC card、hand-held Computer、Cameras and so on. The flash...

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Bibliographic Details
Main Authors: Dong-Lung Lee, 李東隆
Other Authors: Heng-Sheng Huang
Format: Others
Language:en_US
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/81458271778992513299