Noise Performance Analysis of Inverted High Electron Mobility Transistors (IHEMTs)

碩士 === 中國文化大學 === 材料科學與製造研究所 === 89 === Abstract A noise model for High Electron Mobility Transistor (HEMT) or Modulation Doped Field Effect Transistor (MODFET) had been presented [37, 38]. The model is based on a self-consistent solution of the Schrödinger and Poisson’s equati...

Full description

Bibliographic Details
Main Authors: Steven Liu, 劉智立
Other Authors: Fong-Ming Lee
Format: Others
Language:zh-TW
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/51806343550547022353