High Precision and Low Cost Voltage Metrology
碩士 === 國立中央大學 === 電機工程研究所 === 89 === In recent years, the demand of mixed signal testing and fast development of system on chip technology are high due to the size of the chip grows larger and larger. However, faster and more complex test equipments are needed to meet the much demanding t...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2001
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| Online Access: | http://ndltd.ncl.edu.tw/handle/27472350038495679912 |