Fatigue Life Analysis for Solder Joints of Flip Chip Package

碩士 === 國立交通大學 === 機械工程系 === 89 === Flip chip package has become a very attractive solution with increasing demand on low cost, miniaturization, and weight reduction of electronic products. The major reliability issue of flip chip package is solder joint crack due to thermal expansion mis...

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Bibliographic Details
Main Authors: Juei-Sien Liu, 劉睿賢
Other Authors: Chinghua Hung
Format: Others
Language:zh-TW
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/99203075074050538842