The Integrated Circuit Final Testing Scheduling Problem

• Main Authors: An-Yi Chen, 陳安怡
• Other Authors: Wen-Lea Pearn
• Format: Others
• Language: zh-TW
• Published: 2001
• Online Access: http://ndltd.ncl.edu.tw/handle/39117335173370137729

碩士 === 國立交通大學 === 工業工程與管理系 === 89 === The integrated-circuit final testing scheduling problem (ICFTSP) with reentry, is a variation of the complex flow-shop scheduling problem, which is also a generalization of the classical reentrant flow batch process, and the identical parallel machine problem. In the integrated-circuit (IC) final testing factories, the jobs are clustered by their product types, which must be processed on groups of parallel machines at various process stages following the manufacturing sequence, which must be completed before the due dates. The job processing time depends on the product type, and the machine setup time is sequentially dependent on the orders of jobs processed. Since the ICFTSP with reentry has reentry characteristic, and involves job processing precedence, serial stage, batch stage, job clusters, job-cluster dependent processing time, due dates, machine capacity, and sequence dependent setup time, it is more difficult to solve than the classical flow-shop scheduling problem and the parallel-machine scheduling problem which have been investigated extensively. In this research, we consider a more general version of ICFTSP with reentrant flow lines and each job cluster containing multiple jobs. We formulate the ICFTSP as an integer programming problem to minimize the total machine workload that can represent the utilization rate interested by manufacturer in the semiconductor industry. To illustrate the applicability of the linear integer programming model, we run the integer programming model using the IP software CPLEX 6.0 to solve a small ICFTSP example. And We present a case study on ICFTSP, which is taken from am IC final testing factory located on the Industrial Park in Hsin-Chu, Taiwan, covering all manufacturing process stages (serial and batch processing) where the total machine workload is minimized. We also present two fast network algorithms to efficiently solve the ICFTSP with reentry. Details of the schedules for this case, and the workload for each individual machine are provided.