The Integrated Circuit Final Testing Scheduling Problem

碩士 === 國立交通大學 === 工業工程與管理系 === 89 === The integrated-circuit final testing scheduling problem (ICFTSP) with reentry, is a variation of the complex flow-shop scheduling problem, which is also a generalization of the classical reentrant flow batch process, and the identical parallel machine problem....

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Bibliographic Details
Main Authors: An-Yi Chen, 陳安怡
Other Authors: Wen-Lea Pearn
Format: Others
Language:zh-TW
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/39117335173370137729