Probabilistic Failure Modes Characterization for Viscoelastoplastic IC Packages
碩士 === 國立成功大學 === 機械工程學系 === 89 === ABSTRACT The increase in circuit density and decrease in volume size in IC packages have emerged as an inevitable trend in recent years. As a result, the reliability of IC packages becomes very stern. The study of impact factors such as the p...
Main Authors: | Hsien-Shun Huang, 黃顯順 |
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Other Authors: | Hsin-Yi Lai |
Format: | Others |
Language: | zh-TW |
Published: |
2001
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Online Access: | http://ndltd.ncl.edu.tw/handle/65897574055713971448 |
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