Probabilistic Failure Modes Characterization for Viscoelastoplastic IC Packages

碩士 === 國立成功大學 === 機械工程學系 === 89 === ABSTRACT The increase in circuit density and decrease in volume size in IC packages have emerged as an inevitable trend in recent years. As a result, the reliability of IC packages becomes very stern. The study of impact factors such as the p...

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Bibliographic Details
Main Authors: Hsien-Shun Huang, 黃顯順
Other Authors: Hsin-Yi Lai
Format: Others
Language:zh-TW
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/65897574055713971448