Reducing Test Application Time for Logic-BIST
碩士 === 國立中興大學 === 資訊科學研究所 === 89 === Due to the fast improvement of process technology, the number of transistors continuously increases in a chip, which decreases the testability and increases the testing cost. So, many test methods for large circuit have been developed. Logic-BIST（L-BIST）is suitab...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2001
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| Online Access: | http://ndltd.ncl.edu.tw/handle/88523493494698627476 |