An Input Model for a Semiconductor Final Test Facility

碩士 === 中原大學 === 工業工程研究所 === 89 === In the semiconductor Industry, most of literatures discussed the input model of wafer fabrication. This thesis discussed the input model of the assembly and final test combined facility. It’s based on the assumption of capacity of final test facility to develop a s...

Full description

Bibliographic Details
Main Authors: Chun-Chih Chiu, 邱俊智
Other Authors: Kung-Jeng Wang
Format: Others
Language:zh-TW
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/20507678072494521241