The Current Status and Analysis of Efficiency of Burn-in System from Memory IC Testing Industy in Hsin-Chu
碩士 === 中華大學 === 工業工程與管理研究所 === 89 === The difficulty of testing is increased gradually follows the continuously change of device specification, miniaturization, big capacity and high density for semiconducting products. We always use tester and Burn-in system to fulfill the IC testing. Ho...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2001
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/269g26 |