Photoreflectance and photoluminescence characterization of GaAlAs /InGaAs/GaAs high electron mobility transistor structures

碩士 === 國立海洋大學 === 電機工程學系 === 88 === We have characterized the properties of three AlGaAs/InGaAs/GaAs high electron mobility transistor structure with two different well widths fabricated by molecular beam epitaxy on (001) GaAs substrates using photoreflectance (PR) and photoluminescence (...

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Bibliographic Details
Main Authors: Tien-Shan Shao, 邵天山
Other Authors: kwong-Kau Tiong
Format: Others
Language:zh-TW
Published: 2000
Online Access:http://ndltd.ncl.edu.tw/handle/30965178176239939614