Fault Detection and Diagnosis of the Plasma Machine using the Modeling Approach

碩士 === 國立交通大學 === 電機與控制工程系 === 88 === In this thesis,we present a fault detection and diagnosis technique for Lam 490 plasma etcher in semiconductor IC fabrication. First, we propose a new dynamic model for the chamber pressure of Lam 490 in terms of gas law of physi...

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Bibliographic Details
Main Authors: Li Huan-Shin, 黎煥欣
Other Authors: Cheng Mu-Huo
Format: Others
Language:en_US
Published: 2000
Online Access:http://ndltd.ncl.edu.tw/handle/25866983064737594656