Thermal Stress Analysis of Electronic Packages

碩士 === 國立交通大學 === 機械工程系 === 88 === The aim of this study is to investigate the failure behavior induced by thermal cyclic loading of the Thermal -Enhanced PBGA. In this study, thermal stress analyses of Au wire, interfaces of different materials and solder balls are carried out by using A...

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Bibliographic Details
Main Authors: Chih-Hung Huang, 黃志宏
Other Authors: Wu-Shung Fu
Format: Others
Language:zh-TW
Published: 2000
Online Access:http://ndltd.ncl.edu.tw/handle/83014860367136633742