Analysis of van der Waals and capacitive forces in atomic force microscopies
碩士 === 國立成功大學 === 機械工程學系 === 88 === The effects of van der Waals and capacitive forces in atomic force microscopies are investigated in both smooth and rough surfaces. The parameters of rough surfaces are considered the sizes of grain and the distances between a sample and a microscopic tip. The geo...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/72105909006874040789 |