用高能量電子繞射及掃描穿隧電子顯微術探討分子術磊晶的Mg/MgO(110)介面與Mg的皺化
碩士 === 國立中正大學 === 物理系 === 88 === We grow Mg/MgO(110) by MBE and use in situ reflection high electron diffraction (RHEED) to measure the original stage of the growth and then use scanning tunneling microscope (STM) to obtain the surface images until the film gets thicker. We get a clear picture of th...
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| Format: | Others |
| Language: | zh-TW |
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2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/92334194354879720708 |