Interficial Reactions of Ni Thin Films on Si1-xGex Substrates

碩士 === 國立清華大學 === 材料科學工程學系 === 87 === Interfacial reactions of Ni on epitaxially grown Si1-xGex strained layer have been investigated. Ni thin films ( 300 A ) were evaporated by an electron beam evaporation system on the Si1-xGex substrates at room temperature. The solid-phase...

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Bibliographic Details
Main Authors: Chi-Shen Lee, 李啟聖
Other Authors: Lih-Juann Chen
Format: Others
Language:en_US
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/17665967814948490239