應用B-Spline曲線於CCD次像素技術之研究
碩士 === 國立中央大學 === 機械工程研究所 === 87 === Recently image processing development is using image information to check the technology about the profile or surface texture of object except simple improving image quality. The optical metrology can decrease measurement time and increase resolution c...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
1999
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| Online Access: | http://ndltd.ncl.edu.tw/handle/54978959373209375111 |