Three Dimension Surface Measurement Using Two-wavelength Phsae-shifting Interferometry
碩士 === 國立交通大學 === 光電工程所 === 87 === In this thesis, our purpose is to improve the measurement limitation of the vertical depth in single-wavelength phase-shifting interferometry (PSI), in which the depth difference between adjacent pixels is required to be less than a quarter of wavelength. We combin...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1999
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/77298585398483380030 |