An Analytical Delay Model for Read Operation on Dynamic Random Access Memory Bit Lines

碩士 === 國立中興大學 === 電機工程學系 === 87 === As VLSI circuits migrate to high density, DRAM device technology advances to the deep sub-micron range. The small devices can meet the requirement of the high-speed and high-density, but many other problems degrade circuit performance or even invalidate...

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Bibliographic Details
Main Authors: Chia-Hsiang Shih, 施家祥
Other Authors: Hongchin Lin
Format: Others
Language:zh-TW
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/85749102405893791140

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