Cobalt Salicided Ultra Shallow Junction Formation Technologies for ULSI Applications

碩士 === 逢甲大學 === 電機工程學系 === 87 === Several methods for forming cobalt salicided p+/n ultra shallow junction have been studied. The application for p+/n shallow junction formed with low energy ion implantation was first investigated in the thesis. The shallower doping profiles were obtained by the low...

Full description

Bibliographic Details
Main Authors: Kuo Wei Chu, 朱國偉
Other Authors: Wen Luh Yang
Format: Others
Language:en_US
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/68191083942091798468

Similar Items