Crystal Growth and Characterization of Cd1-xFexTe
碩士 === 中原大學 === 物理學系 === 87 === ABSTRACT Modulation reflectance spectroscopy has been used to study the semimagnetic semiconductor (SMSC) Cd1－xFexTe single crystals grown by Vertical Bridgman Technique. The iron molar fraction x was determined by X-ray Energy Dispersion Spectro...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
1999
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| Online Access: | http://ndltd.ncl.edu.tw/handle/25642620273048002846 |