Test Pattern Generation for Built-In Self-Test and Multi-chip Modules
博士 === 國立臺灣大學 === 電機工程學系 === 86 === The built-in self-test (BIST) is a powerful test strategy for very large scale integrated circuit, such as microprocessors, multi-chip modules (MCM). It performs not only fast and efficient but also hierarchical testin...
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| Format: | Others |
| Language: | en_US |
| Published: |
1998
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| Online Access: | http://ndltd.ncl.edu.tw/handle/40256926224602736200 |