Photoreflectance and Raman Scattering Characterization on InAs/GaAs Quantum Dots

碩士 === 國立臺灣大學 === 光電工程學研究所 === 86 === Detailed investigation of photoreflectance (PR) and Raman scattering (RS) are used to study self-organized InAs quantum dots (QDs) both grown on (100) and (100) misoriented 7 degree toward (100) GaAs substrates w...

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Bibliographic Details
Main Authors: Chang, Sheng-Ming, 張聖明
Other Authors: Gwo-Jen Jan
Format: Others
Language:en_US
Published: 1998
Online Access:http://ndltd.ncl.edu.tw/handle/94375863012437392465