Observation of Gas Flow and Wafer Temperature Measurement in a Model Lamp Heated Vertical CVD Reactor

碩士 === 國立交通大學 === 機械工程研究所 === 86 ===   An experimental lamp heated, rapid thermal, vertical single-wafer reactor was established to study the gas flow and heat transfer driven by the inertia of the inlet flow and the buoyancy due to the wafer heating. Effects of placing a thick copper plate beneath...

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Main Authors: Hsiao, Cheng-Chiu, 蕭澄秋
Other Authors: Lin, Tsing-Fa
Format: Others
Language:en_US
Published: 1998
Online Access:http://ndltd.ncl.edu.tw/handle/37631571590673157762
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spelling ndltd-TW-086NCTU34890422015-10-13T11:06:15Z http://ndltd.ncl.edu.tw/handle/37631571590673157762 Observation of Gas Flow and Wafer Temperature Measurement in a Model Lamp Heated Vertical CVD Reactor 燈源加熱之垂直CVD反應爐內流場及晶圓溫度量測之研究 Hsiao, Cheng-Chiu 蕭澄秋 碩士 國立交通大學 機械工程研究所 86   An experimental lamp heated, rapid thermal, vertical single-wafer reactor was established to study the gas flow and heat transfer driven by the inertia of the inlet flow and the buoyancy due to the wafer heating. Effects of placing a thick copper plate beneath the wafer on the uniformity of the wafer temperature and effects of the showerhead on the resulting flow in the reaction chamber were examined. In particular, the flow patterns in the reactor resulting from a vertical gas jet impinging on the wafer were examined in detail. The results indicated that adding the copper plate can effectively reduce the nonuniformity of the wafer temperature. Besides, using a showerhead with finer holes in it results in a better flow distribution in the reactor. For a jet impinging on the wafer, the buoyancy induces a circular vortex roll surrounding the axis of the chamber right on the wafer. At high buoyancy-to -inertia ratio the vortex roll is highly deformed and nonaxisymmetric. Finally, the generation of new roll by splitting from the original roll was noted during the transient roll formation processes. Lin, Tsing-Fa 林清發 1998 學位論文 ; thesis 64 en_US
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language en_US
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sources NDLTD
description 碩士 === 國立交通大學 === 機械工程研究所 === 86 ===   An experimental lamp heated, rapid thermal, vertical single-wafer reactor was established to study the gas flow and heat transfer driven by the inertia of the inlet flow and the buoyancy due to the wafer heating. Effects of placing a thick copper plate beneath the wafer on the uniformity of the wafer temperature and effects of the showerhead on the resulting flow in the reaction chamber were examined. In particular, the flow patterns in the reactor resulting from a vertical gas jet impinging on the wafer were examined in detail. The results indicated that adding the copper plate can effectively reduce the nonuniformity of the wafer temperature. Besides, using a showerhead with finer holes in it results in a better flow distribution in the reactor. For a jet impinging on the wafer, the buoyancy induces a circular vortex roll surrounding the axis of the chamber right on the wafer. At high buoyancy-to -inertia ratio the vortex roll is highly deformed and nonaxisymmetric. Finally, the generation of new roll by splitting from the original roll was noted during the transient roll formation processes.
author2 Lin, Tsing-Fa
author_facet Lin, Tsing-Fa
Hsiao, Cheng-Chiu
蕭澄秋
author Hsiao, Cheng-Chiu
蕭澄秋
spellingShingle Hsiao, Cheng-Chiu
蕭澄秋
Observation of Gas Flow and Wafer Temperature Measurement in a Model Lamp Heated Vertical CVD Reactor
author_sort Hsiao, Cheng-Chiu
title Observation of Gas Flow and Wafer Temperature Measurement in a Model Lamp Heated Vertical CVD Reactor
title_short Observation of Gas Flow and Wafer Temperature Measurement in a Model Lamp Heated Vertical CVD Reactor
title_full Observation of Gas Flow and Wafer Temperature Measurement in a Model Lamp Heated Vertical CVD Reactor
title_fullStr Observation of Gas Flow and Wafer Temperature Measurement in a Model Lamp Heated Vertical CVD Reactor
title_full_unstemmed Observation of Gas Flow and Wafer Temperature Measurement in a Model Lamp Heated Vertical CVD Reactor
title_sort observation of gas flow and wafer temperature measurement in a model lamp heated vertical cvd reactor
publishDate 1998
url http://ndltd.ncl.edu.tw/handle/37631571590673157762
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