The Application of Taguchi Method Analysis in Chip/Encapsulant Defect and Thermal-Pulsed on PDIP Package Adhesive due to Edge Stress

碩士 === 國立成功大學 === 工程科學系 === 86 ===

Bibliographic Details
Main Authors: Tsao, hui-min, 曹惠旻
Other Authors: CHEN RONG-SHENG
Format: Others
Language:zh-TW
Published: 1998
Online Access:http://ndltd.ncl.edu.tw/handle/43632260784491018711