The Fabrication of ACTFEL Device by Double Ion Sources Enhancing Electron Beam Deposition

碩士 === 輔仁大學 === 物理學研究所 === 86 === In our work, we synthesize ZnS thin films containing 5% Mn by Double Ion Sources Enhancing Electron Beam Deposition. Using the insulator material SiO2, and Ta2O5, an electrode Ti by R.F. Sputter, is necessary to fabricate an ACTFEL display device. From results m...

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Bibliographic Details
Main Author: 管台強
Other Authors: 凌國基
Format: Others
Language:zh-TW
Published: 1998
Online Access:http://ndltd.ncl.edu.tw/handle/31001461398933612667
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spelling ndltd-TW-086FJU031980052015-10-13T11:03:30Z http://ndltd.ncl.edu.tw/handle/31001461398933612667 The Fabrication of ACTFEL Device by Double Ion Sources Enhancing Electron Beam Deposition 以雙離子源輔助電子束蒸鍍製作交流電激光發光薄膜元件 管台強 碩士 輔仁大學 物理學研究所 86 In our work, we synthesize ZnS thin films containing 5% Mn by Double Ion Sources Enhancing Electron Beam Deposition. Using the insulator material SiO2, and Ta2O5, an electrode Ti by R.F. Sputter, is necessary to fabricate an ACTFEL display device. From results mentioned above, an ACTFEL display device with Glass/ITO/SiO2/Ta205/ZnS+Mn(5%)/SiO2/Ta2O5/Ti structure has been fabricated. The substrate area is 76x25 mm2 and the effective area is 20x8 mm2 The substrate area is 38x25 mm2 and the effective area is 10x8 mm At lk Hz square wave excitation voltage, the threshold voltage of the device is 17OV. 凌國基 1998 學位論文 ; thesis 68 zh-TW
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language zh-TW
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description 碩士 === 輔仁大學 === 物理學研究所 === 86 === In our work, we synthesize ZnS thin films containing 5% Mn by Double Ion Sources Enhancing Electron Beam Deposition. Using the insulator material SiO2, and Ta2O5, an electrode Ti by R.F. Sputter, is necessary to fabricate an ACTFEL display device. From results mentioned above, an ACTFEL display device with Glass/ITO/SiO2/Ta205/ZnS+Mn(5%)/SiO2/Ta2O5/Ti structure has been fabricated. The substrate area is 76x25 mm2 and the effective area is 20x8 mm2 The substrate area is 38x25 mm2 and the effective area is 10x8 mm At lk Hz square wave excitation voltage, the threshold voltage of the device is 17OV.
author2 凌國基
author_facet 凌國基
管台強
author 管台強
spellingShingle 管台強
The Fabrication of ACTFEL Device by Double Ion Sources Enhancing Electron Beam Deposition
author_sort 管台強
title The Fabrication of ACTFEL Device by Double Ion Sources Enhancing Electron Beam Deposition
title_short The Fabrication of ACTFEL Device by Double Ion Sources Enhancing Electron Beam Deposition
title_full The Fabrication of ACTFEL Device by Double Ion Sources Enhancing Electron Beam Deposition
title_fullStr The Fabrication of ACTFEL Device by Double Ion Sources Enhancing Electron Beam Deposition
title_full_unstemmed The Fabrication of ACTFEL Device by Double Ion Sources Enhancing Electron Beam Deposition
title_sort fabrication of actfel device by double ion sources enhancing electron beam deposition
publishDate 1998
url http://ndltd.ncl.edu.tw/handle/31001461398933612667
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AT guǎntáiqiáng fabricationofactfeldevicebydoubleionsourcesenhancingelectronbeamdeposition
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