| Summary: | 碩士 === 中原大學 === 應用物理研究所 === 86 === The optical constants, complex refractive index and thickness of thin films, are very important parameters for the design and manufature of thin films system. The envelope method and the curve fitting have been applied to measurement of the optical constants of the thin film over the visible and near IR spectral regions. By using the method, the optical constant of thin film have been compared to those of the ellipsometry measurement in this work. And the resolution of the extinction coefficient, k, can be reached to the order of 10-4.
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