The Determination of Optical Constants by Using the Modified Envelope Method for Thin Films
碩士 === 中原大學 === 應用物理研究所 === 86 === The optical constants, complex refractive index and thickness of thin films, are very important parameters for the design and manufature of thin films system. The envelope method and the curve fitting have been applied to measurement of the optical const...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1997
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/56706365176631311474 |