The programming capability characterization study of split gate EEPROM cell
碩士 === 國立交通大學 === 電子工程學系 === 85 === The hot electron injection of split gate EEPROM cell is taken advantage of the high electric field result from weak- gate-control region. It is different from the conventional stack gate device which...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1997
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| Online Access: | http://ndltd.ncl.edu.tw/handle/31277461469347809101 |