The Design and Analysis of Electrostatic Discharge Protection Devices and Circuits Using Transmission-Line-Pulsing Technique and Substrate-Triggering Technique
碩士 === 國立交通大學 === 電子工程學系 === 85 === In the advanced deep-submicron CMOS technology, it is more difficult to prevent damages from the ESD (Electrostatic Discharge) stresses. To understand the physical characteristics and ESD robustness of p...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
1997
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| Online Access: | http://ndltd.ncl.edu.tw/handle/14378832808016116004 |