Delay Testing and Fault Simulation for Digital Circuits
博士 === 國立交通大學 === 電子工程學系 === 85 === This dissertation is divided into two parts. The former investigates delay fault testing and the latter is dedicated to distributed fault simulation.Concerning delay fault testing, a new test methodology, oscillation r...
Main Authors: | Wu, Wen Ching, 吳文慶 |
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Other Authors: | Chung Len Lee |
Format: | Others |
Language: | zh-TW |
Published: |
1997
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Online Access: | http://ndltd.ncl.edu.tw/handle/40932076344900934091 |
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