Delay Testing and Fault Simulation for Digital Circuits

博士 === 國立交通大學 === 電子工程學系 === 85 === This dissertation is divided into two parts. The former investigates delay fault testing and the latter is dedicated to distributed fault simulation.Concerning delay fault testing, a new test methodology, oscillation r...

Full description

Bibliographic Details
Main Authors: Wu, Wen Ching, 吳文慶
Other Authors: Chung Len Lee
Format: Others
Language:zh-TW
Published: 1997
Online Access:http://ndltd.ncl.edu.tw/handle/40932076344900934091